Short Channel Threshold Voltage Reduction
Short Channel Threshold Voltage Reduction is defined as a reduction in threshold voltage of MOSFET due to short channel effect.
Symbol: ΔVT0
Measurement: Electric PotentialUnit: V
Note: Value should be greater than 0.
Acceptor Concentration
Acceptor Concentration refers to the concentration of acceptor dopant atoms in a semiconductor material.
Symbol: NA
Measurement: Carrier ConcentrationUnit: 1/cm³
Note: Value should be greater than 0.
Surface Potential
Surface Potential is a key parameter in evaluating the DC property of thin-film transistors.
Symbol: Φs
Measurement: Electric PotentialUnit: V
Note: Value should be greater than 0.
Junction Depth
Junction Depth is defined as the distance from the surface of a semiconductor material to the point where a significant change in the concentration of dopant atoms occurs.
Symbol: xj
Measurement: LengthUnit: μm
Note: Value should be greater than 0.
Oxide Capacitance per Unit Area
Oxide Capacitance per Unit Area is defined as the capacitance per unit area of the insulating oxide layer that separates the metal gate from the semiconductor material.
Symbol: Coxide
Measurement: Oxide Capacitance Per Unit AreaUnit: μF/cm²
Note: Value should be greater than 0.
Channel Length
Channel Length refers to the physical length of the semiconductor material between the source and drain terminals within the transistor structure.
Symbol: L
Measurement: LengthUnit: μm
Note: Value should be greater than 0.
P-n Junction Depletion Depth with Source
P-n Junction Depletion Depth with Source is defined as the region around a p-n junction where charge carriers have been depleted due to the formation of an electric field.
Symbol: xdS
Measurement: LengthUnit: μm
Note: Value should be greater than 0.
P-n Junction Depletion Depth with Drain
P-n Junction Depletion Depth with Drain is defined as the extension of the depletion region into the semiconductor material near the drain terminal.
Symbol: xdD
Measurement: LengthUnit: μm
Note: Value should be greater than 0.
Charge of electron
Charge of electron is a fundamental physical constant, representing the electric charge carried by an electron, which is the elementary particle with a negative electric charge.
Symbol: [Charge-e]
Value: 1.60217662E-19 C
Permittivity of silicon
Permittivity of silicon measures its ability to store electrical energy in an electric field, vital in semiconductor technology.
Symbol: [Permitivity-silicon]
Value: 11.7
Permittivity of vacuum
Permittivity of vacuum is a fundamental physical constant that describes the ability of a vacuum to permit the transmission of electric field lines.
Symbol: [Permitivity-vacuum]
Value: 8.85E-12 F/m